DocumentCode :
3197783
Title :
Occurrence of features of fiber Bragg grating spectra having a wavelength corresponding to the phase mask periodicity
Author :
Yam, Sui P. ; Brodzeli, Zourab ; Wade, Scott A. ; Baxter, Greg W. ; Collins, Stephen F.
Author_Institution :
Opt. Technol. Res. Lab., Victoria Univ., Melbourne, VIC, Australia
fYear :
2008
fDate :
7-9 Nov. 2008
Firstpage :
1
Lastpage :
4
Abstract :
Use of a phase mask with 536 nm uniform pitch allowed the fabrication of a fiber Bragg grating for use at a Bragg wavelength of 785 nm. Reflection and transmission features at 1552 nm, i.e. twice the Bragg wavelength, associated with the phase mask periodicity were observed. However, when phase mask orders other than plusmn1 were absent during fabrication the features at 1552 nm were not evident.
Keywords :
Bragg gratings; Talbot effect; Bragg wavelength; Talbot interferometer; fiber Bragg grating spectra; phase mask periodicity; wavelength 1552 nm; wavelength 785 nm; Bragg gratings; Fabrication; Fiber gratings; Interference; Optical diffraction; Optical fibers; Optical filters; Optical interferometry; Optical reflection; Power harmonic filters; Talbot interferometer; double of the Bragg wavelength; fiber Bragg grating; phase mask;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Fiber Sensors Conference, 2008. APOS '08. 1st Asia-Pacific
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2131-2
Electronic_ISBN :
978-1-4244-2132-9
Type :
conf
DOI :
10.1109/APOS.2008.5226316
Filename :
5226316
Link To Document :
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