• DocumentCode
    3197934
  • Title

    [Front cover]

  • fYear
    2011
  • fDate
    16-20 Oct. 2011
  • Abstract
    The following topics are dealt with: BTI; III-V devices; circuits; memory; BEOL; hot carriers; fWLR-TDDB; and reliabilty.
  • Keywords
    digital storage; hot carriers; networks (circuits); reliability; semiconductor devices; BEOL; BTI; III-V devices; TDDB; bias temperature instability; fWLR; hot carriers; memory; reliabilty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
  • Conference_Location
    South Lake Tahoe, CA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4577-0113-9
  • Type

    conf

  • DOI
    10.1109/IIRW.2011.6142568
  • Filename
    6142568
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3197934