DocumentCode :
3197952
Title :
Thermal management of on-chip hot spots and 3D chip stacks
Author :
Bar-Cohen, Avram
Author_Institution :
Dept. of Mech. Eng., Univ. of Maryland, College Park, MD, USA
fYear :
2009
fDate :
9-11 Nov. 2009
Firstpage :
1
Lastpage :
8
Abstract :
The rapid increase in on-chip heat fluxes and package heat density, accompanying the migration to nanoelectronics and 3D chip stacks, has placed thermal management squarely on the critical path for advanced product development. Innovative, cost-effective cooling techniques, combined in a synergetic way with more conventional approaches, must be developed if the benefits of the Moore´s Law progression are to be realized. Following a brief discussion of the industry roadmap for IC packaging and review of chip package thermal management options, attention will turn to the application of solidstate thermoelectric refrigeration and the thermal characteristics of direct immersion cooling in dielectric liquids. The presentation will close with a discussion of the research challenges associated with the commercial implementation of on-chip thermoelectric coolers and direct liquid cooling.
Keywords :
cooling; integrated circuit packaging; nanoelectronics; thermal management (packaging); 3D chip stacks; IC packaging; Moore´s law progression; chip package thermal management; cost-effective cooling techniques; dielectric liquids; direct immersion cooling; direct liquid cooling; nanoelectronics; on-chip heat fluxes; on-chip hot spots; on-chip thermoelectric coolers; package heat density; solid-state thermoelectric refrigeration; Dielectric liquids; Immersion cooling; Integrated circuit packaging; Liquid cooling; Moore´s Law; Nanoelectronics; Product development; Refrigeration; Thermal management; Thermoelectricity; 3D packaging; Hot Spot; immersion cooling; thermoelectric cooling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4244-3985-0
Type :
conf
DOI :
10.1109/COMCAS.2009.5385939
Filename :
5385939
Link To Document :
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