مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3198012

Title :

Wafer Level Reliability

fYear :

2011

fDate :

16-20 Oct. 2011

Abstract :

Presents slides from a workshop on wafer level reliability.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International

Conference_Location :

South Lake Tahoe, CA

ISSN :

1930-8841

Print_ISBN :

978-1-4577-0113-9

Type :

conf

DOI :

10.1109/IIRW.2011.6142573

Filename :

6142573

Link To Document :