Title : 
A methodological approach for the minimization of self-interference effects in highly integrated transceiver SoCs
         
        
            Author : 
Eliezer, Oren E. ; Staszewski, R. Bogdan ; Balsara, Poras T.
         
        
            Author_Institution : 
Texas Instrum. Inc., Dallas, TX, USA
         
        
        
        
        
        
            Abstract : 
A design methodology is introduced, which is aimed at the minimization of the duration and costs associated with the productization of complex transceiver system-on-chip (SoC) solutions that typically exhibit self-interference problems once fabricated. Such products comprise extensive digital circuitry, mixed-signal functions, and sensitive RF blocks, creating high potential for self-interference within the SoC. The proposed design-for-interference-mitigation (DfIM) approach uses the existing on-chip processing and memory resources to effectively address these problems, thus eliminating the need for a hardware revision and saving the associated time and cost. Two implementation examples for this methodology in Digital RF Processor (DRP¿)-based wireless SoCs are shown to demonstrate the effectiveness of the approach.
         
        
            Keywords : 
mobile radio; system-on-chip; transceivers; complex transceiver system-on-chip; design-for-interference-mitigation; digital RF processor; highly integrated transceiver SoC; mobile transceivers; self-interference effects; wireless SoC; Circuits; Costs; Design methodology; Hardware; Interference; Minimization methods; Radio frequency; Signal design; System-on-a-chip; Transceivers; Digital RF Processor (DRP); System-on-chip (SoC); design methodology; interference mitigation; wireless transceiver;
         
        
        
        
            Conference_Titel : 
Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
         
        
            Conference_Location : 
Tel Aviv
         
        
            Print_ISBN : 
978-1-4244-3985-0
         
        
        
            DOI : 
10.1109/COMCAS.2009.5385949