• DocumentCode
    3198138
  • Title

    Characterization of a 90 degrees curved microstrip transmission line in the time-domain and frequency-domain with 3D-TLM-method and measurements

  • Author

    Thomann, W. ; Isele, B. ; Russer, P.

  • Author_Institution
    Lehrstuhl fuer Hochfrequenztech., Tech. Univ., Munchen, Germany
  • fYear
    1992
  • fDate
    18-25 June 1992
  • Firstpage
    658
  • Abstract
    A 90 degrees curved microstrip transmission line is characterized in the time domain and frequency domain with the transmission line matrix method in 3D space and with supporting measurements up to 40 GHz. Results of this structure realized on 10 mm alumina substrate are presented. The S-parameters as a function of frequency and the time-domain step response are discussed in detail. The microstrip line consists of a bend with short straight transmission lines on both sides of the bend. The structure is placed in a 90 degrees corner with two electric walls, which represent a housing. The other two sides and the top lid are far removed in order to avoid any additional disturbances of the fields. Measurements and simulation verify the operation at frequencies above 40 GHz.<>
  • Keywords
    S-parameters; microstrip lines; step response; time-frequency analysis; transmission line theory; 0.01 to 40 GHz; 10 mm; 3D space; 90 degrees curved microstrip transmission line; Al/sub 2/O/sub 3/ substrate; EHF; HF; S-parameters; SHF; UHF; VHF; electric walls; frequency domain; step response; straight transmission lines; time domain; transmission line matrix method; Extraterrestrial measurements; Frequency domain analysis; Frequency measurement; Microstrip; Scattering parameters; Time domain analysis; Time measurement; Transmission line matrix methods; Transmission line measurements; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-0730-5
  • Type

    conf

  • DOI
    10.1109/APS.1992.221851
  • Filename
    221851