Title :
The Performance of an adaptive noise canceller with DSP processor
Author :
Ryu, Boo-Shik ; Lee, Jae-Kyun ; Kim, Joonwan ; Lee, Chae-Wook
Author_Institution :
Daegu Univ., Gyeongsan
Abstract :
Among all adaptive noise cancellers, Widrow and Hoff´s least mean square (LMS) algorithm has probably become the most popular because of its robustness, good tacking properties and simplicity of implementation. An important limitation of LMS algorithm is that the selection of a certain value for the step size implies compromise between speed of convergence and steady-state misadjustment, The variable step size normalized least-mean-square (VSS- NLMS) algorithm is appropriate to solve the conflicting requirement of fast convergence and low misadjustment of the LMS algorithm. To reduce noise in the output signal of the ANC, a step size for coefficient update is controlled according to the signal-to-noise ratio (SNR). This paper investigates the performance of a noise canceller with DSP processor (TI TMS320C6713) using the LMS algorithm, normalized least-mean-square (NLMS) algorithm, and VSS-NLMS algorithm. Results show the proposed combination of hardware and VSS-NLMS algorithm has not only a faster convergence rate but also lower distortion when compared with the fixed step size LMS algorithm and NLMS algorithm in real-time environments.
Keywords :
digital signal processing chips; least mean squares methods; signal denoising; DSP processor; Hoff least mean square algorithm; TI TMS320C6713; VSS- NLMS algorithm; adaptive noise cancellers; fast convergence; lower distortion; normalized least-mean-square algorithm; signal-to-noise ratio; steady-state misadjustment; variable step size normalized least-mean-square; Convergence; Digital signal processing; Hardware; Least squares approximation; Noise cancellation; Noise reduction; Noise robustness; Signal to noise ratio; Size control; Steady-state;
Conference_Titel :
System Theory, 2008. SSST 2008. 40th Southeastern Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-1806-0
Electronic_ISBN :
0094-2898
DOI :
10.1109/SSST.2008.4480186