Title :
A very high current, wide bandwidth voltage source for microprocessor testing
Author :
Barabas, Neil J.
Author_Institution :
B&R Electron., Chatsworth, CA, USA
Abstract :
The design of a unique, state-of-the-art voltage source (Vs) is described. It is a subsystem of a VLSI tester, and powers the device under test (DUT). It is fully programmable and has extensive measurement capabilities. Its ratings include zero to 6 volts output at 50 amps per circuit board, 300 Amps maximum, with an under 1 μsec response time to transient loads
Keywords :
DC-DC power convertors; VLSI; computer testing; integrated circuit testing; microprocessor chips; power amplifiers; power supplies to apparatus; 0 to 6 V; 300 A; 50 A; VLSI tester; device under test; microprocessor testing; ratings; response time; state-of-the-art; transient loads; wide bandwidth voltage source; Bandwidth; Circuit testing; Current measurement; DC-DC power converters; Delay; Electronic equipment testing; Microprocessors; Power amplifiers; Printed circuits; Voltage;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1998. APEC '98. Conference Proceedings 1998., Thirteenth Annual
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4340-9
DOI :
10.1109/APEC.1998.647684
