DocumentCode :
3198619
Title :
Depth restoration from defocused images using simulated annealing
Author :
Prasad, K. Venkatesh ; Mammone, Richard J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume :
i
fYear :
1990
fDate :
16-21 Jun 1990
Firstpage :
227
Abstract :
The recovery of depth from defocused images is formulated as a 3-D image restoration problem. A defocused image is modeled as the combinatorial outcome of the depths and intensities of the volume elements (voxels) of an opaque 3-D object. A large depth-of-field image is used to constrain the intensities of the voxels. The depths of voxels are estimated from a highly defocused image by using simulated annealing to solve a constrained optimization problem. It is concluded that the method provides a framework for high-resolution depth recovery from defocused images. The method is computationally-intensive; however, it is amenable to parallel processing and is well suited for small field-of-interest applications
Keywords :
pattern recognition; picture processing; simulated annealing; 3-D image restoration; defocused images; depth recovery; optimization; pattern recognition; picture processing; simulated annealing; volume elements; voxels; Computational modeling; Computer simulation; Constraint optimization; Design for disassembly; Image restoration; Integral equations; Machine vision; Pixel; Simulated annealing; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1990. Proceedings., 10th International Conference on
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-8186-2062-5
Type :
conf
DOI :
10.1109/ICPR.1990.118099
Filename :
118099
Link To Document :
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