Title :
Transparent back contacts and interconnect junctions for CdTe top cells
Author :
Parikh, Viral Y. ; Chen, Jie ; Marsillac, S.X. ; Compaan, A.D.
Author_Institution :
Dept. of Phys. & Astron., Toledo Univ., OH
Abstract :
The development of a good, low resistance transparent back contact (TBC) to the superstrate type CdS/CdTe or Cd1-xMgxTe, Cd1-xZnxTe, or Cd1-xMnxTe alloy solar cell is crucial for achieving the best possible four-terminal or two-terminal polycrystalline thin-film tandem solar cell. We find that ZnTe:N/ITO serves as a good TBC to CdS/CdTe solar cell yielding 9.1% power conversion efficiency even without the use of intentional copper at the back contact. A transparent back contact permits device measurements with light incident from the contact side. Such contact-side J-V measurements show that the short-circuit current of ~2 mum thick cells with this TBC is reduced to almost half when measured from the contact side. This difference in current matches quite well with the integrated current calculated from QE done under weak DC white light bias. Similar experiments performed on 0.68 mum cells showed little difference in current between glass-side and contact-side illumination consistent with a stronger collection field in the thin cells
Keywords :
II-VI semiconductors; cadmium compounds; electrical contacts; magnesium compounds; manganese compounds; semiconductor heterojunctions; semiconductor thin films; solar cells; thin film devices; zinc compounds; 0.68 micron; Cd1-xMgxTe; Cd1-xMnxTe; Cd1-xZnxTe; CdS-CdTe; CdTe top cell interconnect junctions; DC white light bias; ITO; InSnO; ZnTe:N; contact-side J-V measurements; contact-side illumination; glass-side illumination; polycrystalline thin-film tandem solar cell; power conversion efficiency; short-circuit current; transparent back contacts; Contact resistance; Current measurement; Indium tin oxide; Manganese alloys; Photovoltaic cells; Power conversion; Tellurium; Thickness measurement; Transistors; Zinc;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279514