DocumentCode :
3198649
Title :
TCAD analysis of breakdown during voltage sweep in a carbon nanofiber (CNF) interconnect
Author :
Brunton, J. ; Yamada, T. ; Weatherford, T.
Author_Institution :
Code EC/WT, Naval Postgrad. Sch., Monterey, CA, USA
fYear :
2011
fDate :
16-20 Oct. 2011
Firstpage :
125
Lastpage :
128
Abstract :
Allotropes to graphene, carbon nanofibers (CNFs) are one of many potential materials for consideration in next generation devices. Because of their high thermal and electrical conductivity they are ideal for use as interconnects. The purpose of this work is to develop a technology computer-aided design (TCAD) device model to recreate the experiments by the Santa Clara University (SCU) [1] concerning the breakdown of CNF interconnect devices as shown in Figure 2. Regarding the modeling efforts, all existing models are 1D and static. To the best of the authors´ knowledge, this would be the first attempt to make a 2D model of a CNF structure and analyze joule heating breakdown. The simulation of the CNF records how the device heats and cools as the voltage increases. The experimental data used various structure configurations created in TCAD.
Keywords :
carbon fibres; electric breakdown; graphene; interconnections; nanofibres; polymorphism; technology CAD (electronics); TCAD analysis; allotropes to graphene; breakdown during voltage sweep; carbon nanofiber interconnect; carbon nanofibers; high thermal; next generation devices; Carbon; Current density; Electric breakdown; Heating; Materials; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
Conference_Location :
South Lake Tahoe, CA
ISSN :
1930-8841
Print_ISBN :
978-1-4577-0113-9
Type :
conf
DOI :
10.1109/IIRW.2011.6142606
Filename :
6142606
Link To Document :
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