• DocumentCode
    3198686
  • Title

    Analytical model for power bipolar transistor in hard and soft-switching applications

  • Author

    Vijayalakshmi, R. ; Trivedi, M. ; Shenai, K.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    374
  • Abstract
    This paper discusses the analytical model developed to explain the dynamics of a power bipolar junction transistor under both hard and soft switching (zero-voltage and zero-current) topologies. The model is developed based on nonquasi-static analysis. It is shown that the carrier dynamics during the turn-off stages of BJT in hard switching varies from soft switching. The carrier profile undergoes significant redistribution, especially in zero-current switching, which results in unique characteristics. Through this model, the physical analysis of the turn-off performance is explained. The model was tested for various critical circuit parameters and switching condition. A good match is observed between the measured and the modeled results, thus validating the model
  • Keywords
    bipolar transistor switches; power bipolar transistors; power semiconductor switches; semiconductor device models; switching circuits; analytical model; carrier dynamics; carrier profile; critical circuit parameters; hard-switching applications; nonquasi-static analysis; power bipolar junction transistor; soft-switching applications; switching condition; turn-off performance; turn-off stages; zero-current switching; zero-current topologies; zero-voltage topologies; Analytical models; Application software; Bipolar transistors; Circuit testing; Electronic mail; Performance analysis; Switching circuits; Topology; Voltage; Zero current switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2000. ISIE 2000. Proceedings of the 2000 IEEE International Symposium on
  • Conference_Location
    Cholula, Puebla
  • Print_ISBN
    0-7803-6606-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2000.930326
  • Filename
    930326