Title :
Development of charged particle detectors by integrating gas amplification stages and CMOS ASICS on wafer level
Author :
Kaminski, Jochen ; Baumgartner, Tobias ; Desch, Klaus ; Ehrmann, Oswin ; Fritzsch, Thomas ; Krautscheid, Thorsten ; Mayer, Stefan ; Töpper, Michael
Author_Institution :
Univ. of Bonn, Bonn, Germany
Abstract :
Gaseous detectors with a highly pixelized readout have demonstrated good capabilities of tracking high energetic particles. In particular, using post-processing methods to integrate the gas amplification stage on top of pixel readout chips has proven to detect single electrons with a very high efficiency and accuracy. So far, these detectors called InGrids or GEMGrids have been produced in a chip based process at the University of Twente. A new wafer based production process has been set up. A first test sample has been produced and tested. Signals from a β as well as from a γ source could be observed.
Keywords :
CMOS analogue integrated circuits; application specific integrated circuits; gas scintillation detectors; nuclear electronics; position sensitive particle detectors; readout electronics; wafer-scale integration; CMOS ASICs; GEMGrid detectors; InGrid detectors; charged particle detectors; gas amplification stage; gaseous detectors; high energetic particle tracking; pixelized readout; wafer based production process; Dielectrics; Electric breakdown; Electrodes;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5642941