DocumentCode :
3199292
Title :
Parameterized Interconnect Modeling and Simulation in VLSI Design Considering Variations
Author :
Liu, Chunchen ; Ruei-Xi Chen ; Huang, Huang ; Fan, Jeffrey
Author_Institution :
Univ. of California at San Diego, La Jolla
fYear :
2008
fDate :
16-18 March 2008
Firstpage :
225
Lastpage :
229
Abstract :
This paper proposed a new algorithm for modeling and simulation of interconnect circuit in nanometer very large scale integration (VLSI) design considering manufacturing process variations. The approach is based on the existing passive reduced-order interconnect macromodeling algorithm (PRIMA). By satisfying the constraints of PRIMA, both macromodel stability and passivity are preserved, so that overall circuit stability is guaranteed for active driver and passive load interconnect circuits. As a result, transfer function of interconnect circuit under the influence of process variation is obtained, where reduction matrix is calculated once only for different values of parameters describing characteristics of process variations. Experiments demonstrate that result from proposed parameterized PRIMA considering process variation is very close to that obtained from PRIMA, while execution time is much less (up to 512X faster).
Keywords :
VLSI; circuit simulation; circuit stability; integrated circuit design; integrated circuit interconnections; matrix algebra; transfer functions; active driver; circuit stability; interconnect circuit simulation; macromodel stability; manufacturing process variations; nanometer very large scale integration design; parameterized interconnect modeling; passive load interconnect circuits; passive reduced-order interconnect macromodeling algorithm; reduction matrix; transfer function; Capacitance; Chip scale packaging; Circuit simulation; Circuit stability; Computational modeling; Delay; Equations; Integrated circuit interconnections; RLC circuits; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Theory, 2008. SSST 2008. 40th Southeastern Symposium on
Conference_Location :
New Orleans, LA
ISSN :
0094-2898
Print_ISBN :
978-1-4244-1806-0
Electronic_ISBN :
0094-2898
Type :
conf
DOI :
10.1109/SSST.2008.4480226
Filename :
4480226
Link To Document :
بازگشت