DocumentCode :
3199384
Title :
Image comparison method for visual quality control based on matrix decomposition
Author :
Hocenski, Zeljko ; Baumgartner, Alfonzo
Author_Institution :
Fac. of Electr. Eng., Josip Juraj Strossmayer Univ. of Osijek, Croatia
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
580
Abstract :
The image processing applied on the original tile image and the replica images in serial production is used for visual quality control. The image of a tile that contains no visual quality error represents the original image. The images of the tiles from the production line that could contain some of the visual quality errors represent the replicas. The image processing is based on the image matrix decomposition method. The matrix form of the original image is transformed to a vector. The images made by the variations of a good original image are transformed to the matrix made by such vectors. Using the SVD of the matrix of variations of the original image makes the image comparison duration shorter. The number of computer operations decreases by using SVD approximation by a lower rank matrix. The SVD calculation of the matrix is done just once so that the image processing time is shorter. Too low a rank of the matrix could yield bad comparison results. The development and testing of this method are used for an early design of the computer aided visual control
Keywords :
automatic optical inspection; image processing; matrix algebra; quality control; singular value decomposition; SVD approximation; ceramic tiles; computer aided visual control; computer operations; image comparison method; image matrix decomposition method; image processing; image processing time; lower rank matrix; matrix decomposition; production line; replica images; singular value decomposition; tile image; visual quality control; Humans; Image processing; Machine vision; Matrix converters; Matrix decomposition; Pixel; Production; Quality control; Testing; Tiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2000. ISIE 2000. Proceedings of the 2000 IEEE International Symposium on
Conference_Location :
Cholula, Puebla
Print_ISBN :
0-7803-6606-9
Type :
conf
DOI :
10.1109/ISIE.2000.930362
Filename :
930362
Link To Document :
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