Title :
Strategy for Certified Reliability Analysis of III-V High Concentration Solar cells
Author :
Gonzalez, J.R. ; Algora, C. ; Stolle, I. Rey ; Alvarez, R. ; Vazquez, M. ; Nunez, N. ; Montalvo, F. ; Barbero, J. ; Cordero, E. ; Galiana, E. ; Díaz, V.
Author_Institution :
Inst. de Energia Solar, Univ. Politecnica de Madrid
Abstract :
In order to get a cost competitive commercial product based in III-V solar cells, a complete assessment of their reliability must be done. A full strategy of tests has been designed to tackle this matter. Real time and homologated accelerated tests are ongoing, as well as a complete statistical analysis which will establish the main reliability parameters and the failure mechanisms
Keywords :
III-V semiconductors; semiconductor device reliability; solar cells; statistical analysis; III-V high concentration solar cells; cost competitive commercial product; failure mechanisms; homologated accelerated tests; real time tests; reliability; statistical analysis; Costs; Degradation; IEC standards; III-V semiconductor materials; ISO standards; Life estimation; Photovoltaic cells; Sun; Telecommunications; Testing;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279552
