• DocumentCode
    3199598
  • Title

    Thermal Aware Clocktree Optimization in Nanometer VLSI Systems Considering Temperature Variations

  • Author

    Liu, Chunchen ; Tan, Jichang ; Chen, Ruei-Xi ; Liu, Guanglei ; Fan, Jeffrey

  • Author_Institution
    Univ. of California at San Diego, La Jolla
  • fYear
    2008
  • fDate
    16-18 March 2008
  • Firstpage
    306
  • Lastpage
    310
  • Abstract
    This paper proposed an accurate yet efficient clocktree synthesis algorithm that tolerates the temperature variation in the nanometer very large scale integration (VLSI) systems. Observing that there exists the correlation between input thermal power and temperature, we propose a clustered perturbation based parameterization to compactly generate a clocktree model considering the temperature variation. Moreover, using a structured and parameterized model reduction, an accurate worst case skew can be efficiently obtained from a transient simulation, which provides both nominal temperatures at those sinks and their sensitivities with respect to the changes of merging points. With the use of the sensitivities from the macromodel, a thermal aware routing based clocktree optimization is performed level by level. The experimental results show that the proposed algorithm reduces up to 1.7X- 5X worst case skew in comparison to the existing approaches.
  • Keywords
    VLSI; optimisation; transient analysis; clocktree synthesis algorithm; clustered perturbation based parameterization; nanometer VLSI systems; nominal temperatures; parameterized model reduction; temperature variations; thermal aware clocktree optimization; thermal aware routing; transient simulation; very large scale integration; Algorithm design and analysis; Clocks; Merging; Routing; Temperature distribution; Temperature sensors; Thermal engineering; Transient analysis; Very large scale integration; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Theory, 2008. SSST 2008. 40th Southeastern Symposium on
  • Conference_Location
    New Orleans, LA
  • ISSN
    0094-2898
  • Print_ISBN
    978-1-4244-1806-0
  • Electronic_ISBN
    0094-2898
  • Type

    conf

  • DOI
    10.1109/SSST.2008.4480243
  • Filename
    4480243