Title :
Benefits of pure palladium for ENEP and ENEPIG surface finishes
Author :
Oezkoek, Mustafa ; Ramos, Gustavo ; Metzger, Dieter ; Roberts, Hugh
Author_Institution :
Atotech Deutschland GmbH, Berlin, Germany
Abstract :
This paper compares the properties of pure palladium versus palladium-phosphorus deposits in surface finishes ENEP (electroless nickel/electroless palladium process) and ENEPIG (electroless nickel/electroless palladium/immersion gold). ENEPIG pand ENEP has recieved increase attention for both packaging/integrated circuit-substrate and PWD applications. The investigation is in terms of hardness between the two types of palladium layers, internal stress, solder spread, surface topography, gold wire bonding process window and copper wire bonding capability. Results show that using electroless pure Pd deposition can enhance the performance of ENEPIG and ENEP surface finishes. In addition to offering the reduction to cost by allowing the reduction in gold thickness, the ENEP surface enables next generation interconnection techniques.
Keywords :
copper; electroless deposition; electronics packaging; gold; hardness; internal stresses; lead bonding; nickel; palladium; palladium alloys; phosphorus alloys; solders; surface finishing; surface topography; Cu; Ni-Pd; Ni-Pd-Au; Ni-PdP; Ni-PdP-Au; copper wire bonding capability; electroless nickel/electroless palladium process; electroless nickel/electroless palladium/immersion gold; gold wire bonding process window; hardness; integrated circuit-substrate; interconnection; internal stress; packaging; solder spread; surface finishes; surface topography; Companies; Nickel; Rough surfaces; Stress; Surface roughness; Surface topography; Wire;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5642965