Title :
Theoretical and experimental study of single and dual-loop optoelectronic oscillators
Author :
Horowitz, M. ; Levy, E.C. ; Okusaga, O. ; Menyuk, C.R. ; Zhou, W. ; Carter, G.M.
Author_Institution :
Electr. Eng. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
Optoelectronic oscillators (OEOs) are used to generate RF signals in the X-band region with a very low phase noise. These hybrid opto-electronic devices are based on a long optical fiber that forms a very high-Q RF cavity. We have studied theoretically and experimentally single-loop and dual-loop optoelectronic oscillators. Excellent agreement between theory and experiments was obtained. The results indicate that flicker noise limits the performance of long cavity OEOs at low frequencies (<500 Hz). We have also studied physical effects in dual-injection locked OEO. The locking of two OEOs with different cavity lengths enables the generation of signals with a very low noise and with very low spurs. We demonstrate theoretically that it is possible to reduce the first spur level by more than 20 dB in compare with that obtained in current experiments.
Keywords :
flicker noise; injection locked oscillators; microwave generation; microwave oscillators; microwave photonics; optical fibres; optical phase locked loops; phase locked oscillators; phase noise; OEO; RF signal generation; X-band region; dual-injection locked OEO; dual-loop optoelectronic oscillators; flicker noise; high-Q RF cavity; hybrid opto-electronic devices; low phase noise; optical fiber; single-loop optoelectronic oscillators; spur level; 1f noise; Injection-locked oscillators; Low-frequency noise; Master-slave; Noise level; Optical fiber filters; Optical fibers; Phase noise; Radio frequency; Signal generators; Electro-optic devices; Electron optics; Fiber optics; Optical injection locking; Optoelectronic Oscillators;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4244-3985-0
DOI :
10.1109/COMCAS.2009.5386024