Title :
Differentiation by the cardinal spline wavelet and its application to the estimation of a transfer function
Author :
Tachibana, Yasuo
Author_Institution :
Dept. of Electr. & Electron. Eng., Kanagawa Inst. of Technol., Japan
Abstract :
In this paper, we consider the differentiation by a wavelet with the scaling function given by the cardinal B-spline and its application to the estimation of a transfer function. As the cardinal B-spline consists of a Riesz base, we can define its conjugate function definitely. In this paper, we propose a calculation method of the conjugate function by the inverse finite Fourier transform. Using the conjugate scaling function given by the numerical data table, we calculate a finite expansion series in a nested subspace of the multiresolution analysis generated by the scaling function. In particular; we can show that the Gibbs´ phenomenon is not aroused at the discontinuity points of a function. Next, we define a several order differential filter from the wavelet expansion formula by the property of the cardinal B-spline. Using these differential filters, we propose an identification method of a transfer function. In order to demonstrate the property and effectiveness of the proposed method, some numerical simulations are presented
Keywords :
Fourier transforms; differentiation; splines (mathematics); transfer functions; wavelet transforms; Gibbs´ phenomenon; Riesz base; cardinal B-spline; cardinal spline wavelet; conjugate function; conjugate scaling function; control engineering; differential filters; differentiation; discontinuity points; finite expansion series; identification method; inverse finite Fourier transform; multiresolution analysis; nested subspace; scaling function; several order differential filter; transfer function estimation; Control engineering; Filters; Fourier transforms; Image processing; Multiresolution analysis; Numerical simulation; Signal processing; Spline; Transfer functions; Wavelet analysis;
Conference_Titel :
Industrial Electronics, 2000. ISIE 2000. Proceedings of the 2000 IEEE International Symposium on
Conference_Location :
Cholula, Puebla
Print_ISBN :
0-7803-6606-9
DOI :
10.1109/ISIE.2000.930381