Title :
Two dimensional modelling of antenna pattern measurements in a panelled compact range at millimetrewaves
Author :
Philippakis, M. ; Parini, C.G.
Author_Institution :
Dept. of Electron. Eng., Queen Mary & Westfield Coll., London, UK
Abstract :
Antenna measurements at high millimeter-wave bands with a paneled compact range are influenced by the existence of gaps. The main effect here is the formation of spurious lobes. Its angular extent is determined by the rotation angles resulting in strong illumination of the gap, assuming the test antenna is transmitting. The effects of gaps directly in the measured pattern were studied, mainly at the frequencies around 180 GHz, where some experimental results were available. The strength of the lobe is affected by many factors: gap width, gap edge misalignment, relative antenna position, antenna size, polarization, and in 3-D the relative orientation between the gap and the path determined by the test antenna axis during rotation. However, the influence of the gap edge misalignment is quite significant. This will be true as long as the misalignment is larger than about lambda /50, especially when the gaps are electrically small. To this end the construction of a paneled CATR should favor the biggest possible size panels.<>
Keywords :
antenna radiation patterns; antenna testing; microwave measurement; 180 GHz; 2D modelling; EHF; antenna pattern measurements; antenna size; electrically small gaps; gap edge misalignment; gap effects; gap width; millimeter-wave bands; millimetrewaves; panelled compact range; path; polarization; relative antenna position; relative orientation; rotation angles; spurious lobes; test antenna; Antenna accessories; Antenna measurements; Aperture antennas; Aperture coupled antennas; Diffraction; Educational institutions; Frequency measurement; Microwave antennas; Microwave bands; System testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221935