DocumentCode
3200081
Title
A Parallel TCXO Test System
Author
Liang Chen ; Feng Tian ; Shunxiao Wu ; Yangbo Huang ; Gang Ou
Author_Institution
Sch. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha, China
fYear
2012
fDate
8-10 Dec. 2012
Firstpage
346
Lastpage
349
Abstract
The present TCXO (Temperature Compensated Crystal Oscillator) test systems have low test efficiency because of frequency meter limited in quantity. This paper proposes a parallel TCXO test system, which uses a parallel frequency meter. The proposed system can test 100 TCXOs simultaneously, and has the frequency measurement error of fully meeting the accuracy requirement of the design and production of state-of-art TCXOs.
Keywords
frequency measurement; frequency meters; measurement errors; frequency measurement error; parallel TCXO test system; parallel frequency meter; temperature compensated crystal oscillator; Clocks; Frequency measurement; Radiation detectors; Standards; Temperature distribution; Temperature measurement; TCXO test system; mass production; parallel frequency meter;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation, Measurement, Computer, Communication and Control (IMCCC), 2012 Second International Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4673-5034-1
Type
conf
DOI
10.1109/IMCCC.2012.85
Filename
6428918
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