Title :
Metamaterials and their applications
Author :
Marcus, Sherman W. ; Schwartz, Chaim ; Naor, Menachem
Author_Institution :
MANOR Div., RAFAEL, Haifa, Israel
Abstract :
The macroscopic behavior of materials in an EM field is determined by their values of permittivity ¿r and permeability ¿r relative to free space which are generally greater than unity. For specially engineered "metamaterials", it has been found possible to obtain other effective values for ¿r and ¿r. Rafael has developed basic phenomenological models for simulating refraction, scattering and transmission effects of metamaterials in a plane wave and/or point source environment. These tools are building blocks for such metamaterial applications as lenses and cloaks, and include hardware design, ray tracing, full wave solutions, scattering and cloaking.
Keywords :
electromagnetic wave reflection; electromagnetic wave refraction; electromagnetic wave scattering; metamaterials; permeability; permittivity; ray tracing; EM field; macroscopic behavior; metamaterials; permeability; permittivity; plane wave; plane wave scattering; point source environment; ray tracing; Electromagnetic scattering; Electrons; Frequency; Lenses; Mathematical model; Metamaterials; Permeability; Permittivity; Plasma applications; Ray tracing; Metamaterials; cloaks; lenses; propagation; ray tracing;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4244-3985-0
DOI :
10.1109/COMCAS.2009.5386055
