Title :
Enabling high volume fine pitch copper wire bonding: Enhancements to process and equipment capability
Author :
Foley, John ; Clauberg, Horst ; Chylak, Bob
Author_Institution :
Kulicke & Soffa Ind., Inc., Fort Washington, PA, USA
Abstract :
Copper wire bonding has matured quickly in recent years, motivated mostly by the significant increase in the cost of gold, which has nearly doubled in the last three years. In response, manufacturers of wire bonding assembly equipment and consumable materials have become committed to support copper wire bonding packaging roadmaps and continue to invest heavily in research and development to create new copper bonding capabilities and advanced processes. Recently, the focus of developing new capabilities has shifted towards developing the more advanced processes that are needed to enable bonding higher pin count, finer pitch, and high performance applications. This paper discusses many of the recent studies performed to improve our fundamental understanding of copper wire bonding. Advanced computational fluid dynamics (CFD) models were created to characterize the inert gas environment requirements for oxide-free copper ball formation and guide development of new gas delivery hardware. 1st and 2nd bond process enhancements have been made, resulting in improved reliability, throughput, and MTBA. Wire loop shaping guidelines for Cu wire are being created with particular attention to ultra-low loop heights. Lastly, bonding with Pd-coated Cu as an alternative to bare Cu wire is discussed.
Keywords :
computational fluid dynamics; copper; fine-pitch technology; lead bonding; reliability; CFD models; Cu; MTBA; advanced computational fluid dynamics models; bond process enhancements; copper wire bonding packaging; gas delivery hardware; high volume fine pitch copper wire bonding; oxide-free copper ball formation; reliability; ultra-low loop heights; wire bonding assembly equipment; wire loop shaping guidelines; Copper; Nitrogen; Visualization;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5643003