Title :
The self-organising feature map in the detection of epileptiform transients in the EEG
Author :
James, Christopher J. ; Jones, Richard D. ; Bones, Philip J. ; Carroll, Grant J.
Author_Institution :
Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
fDate :
31 Oct-3 Nov 1996
Abstract :
A system is proposed which utilises Kohonen´s self-organising feature map (SOFM) to help detect the presence of epileptiform transients in the EEG. The system consists of a feature extractor, which employs a mimetic approach to detect candidate epileptiform transients (CETs) on individual channels in the multichannel recording, followed by a trained SOFM. The SOFM system is proposed as a single channel module of a larger system to detect multichannel epileptiform events by incorporating the outputs of sixteen such modules. The SOFM was trained with CETs obtained from 16-channel bipolar EEG segments of nine patients and fine-tuned through Kohonen´s learning vector quantisation technique (LVQ2). Measures of the sensitivity and specificity of the trained map were obtained by presenting a subset of CETs to the SOFM which had been graded by two to three electroencephalographers as being true or false. The results obtained show that the trained SOFM has a sensitivity of 63% and a specificity of 79% for a 16×16 SOFM
Keywords :
electroencephalography; feature extraction; medical signal processing; self-organising feature maps; vector quantisation; 16-channel bipolar EEG segments; EEG analysis; Kohonen´s self-organising feature map; candidate epileptiform transients; electrodiagnostics; epileptiform transients detection; feature extractor; mimetic approach; multichannel recording; Artificial neural networks; Biomedical engineering; Electroencephalography; Epilepsy; Event detection; Feature extraction; Hospitals; Medical diagnostic imaging; Nervous system; Physics;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.652638