• DocumentCode
    320081
  • Title

    Training neural networks for stimulus artifact reduction in somatosensory evoked potential measurements

  • Author

    Grieve, Richard C W ; Parker, Philip A. ; Hudgins, B.

  • Author_Institution
    Dept. of Biomed. Eng., New Brunswick Univ., Fredericton, NB, Canada
  • Volume
    3
  • fYear
    1996
  • fDate
    31 Oct-3 Nov 1996
  • Firstpage
    917
  • Abstract
    Somatosensory evoked potentials (SEPs) are useful in evaluating the integrity and determining the physiological parameters of the nervous system. Several methods have been proposed to reduce the interference in SEP measurements. Synchronous averaging is useful to reduce random interference, and adaptive methods have been developed to reduce the stimulus artifact. Since artifact and SEP often overlap in time, it has been found that it is useful to train the adaptive filter on the section of artifact before the onset of SEP. An adaptive noise canceller using a feedforward neural network is used to reduce stimulus artifact, and performance is evaluated when training is carried out on only the initial samples of artifact
  • Keywords
    adaptive signal processing; bioelectric potentials; biomedical measurement; feedforward neural nets; interference (signal); medical signal processing; somatosensory phenomena; adaptive filter; adaptive noise canceller; electrodiagnostics; measurement interference reduction; nervous system integrity evaluation; nervous system physiological parameters determination; neural networks training; random interference; somatosensory evoked potential measurements; stimulus artifact reduction; Adaptive filters; Biological neural networks; Biomedical measurements; Electrocardiography; Fingers; Intelligent networks; Interference; Neural networks; Signal to noise ratio; Spinal cord;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-3811-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.1996.652640
  • Filename
    652640