DocumentCode :
3200996
Title :
Precise coupling-of-modes simulation of surface transverse wave devices for frequency control applications
Author :
Hashimoto, Ken-Ya ; Yamaguchi, Masatsune
Author_Institution :
Fac. of Eng., Chiba Univ., Japan
fYear :
1995
fDate :
31 May-2 Jun 1995
Firstpage :
442
Lastpage :
450
Abstract :
The paper proposes a precise simulation method for devices employing surface transverse waves (STWs) which propagate under grating structure and possess strong dispersive nature. The method is based on the coupling-of-modes (COM) theory, where four parameters required for the analysis, i.e., static capacitance, and self-coupling, mutual-coupling and transduction coefficients are determined as a function of frequency by the discrete Green function theory. The method was applied to the simulation STW resonator filters on quartz employing metallic gratings. The result was in good agreement with experiments, and showed that the passband shape as well as the resonance frequency are most dependent on the thickness and width of grating electrodes. This indicates that STWs on quartz with weak piezoelectric coupling are substantially guided close to the surface by mass-loading effect of gratings
Keywords :
Green´s function methods; capacitance; frequency control; quartz; simulation; surface acoustic wave devices; STW devices; STW resonator filters; SiO2; coupling-of-modes simulation; discrete Green function theory; frequency control applications; grating electrode thickness; grating electrode width; grating structure; mass-loading effect; metallic gratings; mutual-coupling; passband shape; precise simulation method; quartz; resonance frequency; self-coupling; static capacitance; surface transverse wave devices; transduction coefficients; weak piezoelectric coupling; Capacitance; Dispersion; Frequency; Gratings; Green function; Mutual coupling; Passband; Resonator filters; Shape; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
Type :
conf
DOI :
10.1109/FREQ.1995.483933
Filename :
483933
Link To Document :
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