• DocumentCode
    320105
  • Title

    Bispectral analysis of EEG burst patterns from piglets during recovery from asphyxia

  • Author

    Muthuswamy, Jitendran ; Sherman, David ; Thakor, Nitish V.

  • Author_Institution
    Dept. of Biomed. Eng., Johns Hopkins Univ., Baltimore, MD, USA
  • Volume
    3
  • fYear
    1996
  • fDate
    31 Oct-3 Nov 1996
  • Firstpage
    984
  • Abstract
    The aim of this study was to study phase coupling among different frequency components in EEC burst patterns observed in piglets during recovery from asphyxia and to compare them with those of the awake baseline EEG data. Phase coupling was quantitated by determining the average bicoherence index within the delta band along the main diagonal in the bifrequency plane. Multiple instances of burst patterns from each experiment were analyzed for phase coupling and compared with the corresponding baseline EEG data. The baseline EEG data did not show any significant phase coupling within the delta band of frequencies in any of the experiments. The raw averaged bicoherence indices within the delta band of bursts was higher than that of corresponding baseline in almost all instances. The authors, therefore, conclude that the delta frequency components of the EEG tend to become more phase coupled during the initial phase of recovery of the brain from an asphyxic injury
  • Keywords
    electroencephalography; medical signal processing; spectral analysis; EEG burst patterns; asphyxia recovery; asphyxic injury; average bicoherence index; awake baseline EEG data; bifrequency plane; bispectral analysis; brain injury recovery; delta band; electrodiagnostics; phase coupling; piglets; Anesthesia; Animals; Asphyxia; Brain injuries; Electroencephalography; Frequency; Lungs; Monitoring; Pattern analysis; Pediatrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-3811-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.1996.652672
  • Filename
    652672