Title :
Development of amorphous silicon based p-i-n solar cell in a superstrate structure with p-microcrystalline silicon as window layer
Author :
Rath, J.K. ; van der Werf, C.H.M. ; Rubinelli, F.A. ; Schropp, R.E.I.
Author_Institution :
Dept. of Atomic & Interface Phys., Utrecht Univ., Netherlands
Abstract :
Single junction p-i-n cells using a p-μc-Si:H layer as the window layer on top of SnO2:F coated glass have been fabricated. For the first time an efficiency of 9.63% could be achieved for a single junction cell with a truly microcrystalline p-layer in a superstrate configuration. This was possible because of the success in depositing thin (15 nm) p-μc-Si:H layer on top of SnO2:F coated glass deposited at low power (100 mW/cm2), moderate temperature (160°C) and conventional frequency (13.56 MHz). This has manifested in excellent blue spectral response and short circuit current. However, open circuit voltage and fill factor were critically dependent on the choice of buffer layer at the p/i interface. Computer simulations point out that this can be attributed to the large valence band offset between the amorphous i-layer and the microcrystalline p-layer. The buffer acts as a barrier to electron back diffusion and it reduces recombination in the p-layer. Tandem cells using both n-μc-Si:H and p-μc-Si:H in the tunnel junction showed an efficiency of 9.9% and FF of 0.73. The tunnel junction n-μc-Si:H/p-μc-Si:H needed an oxide interface layer for a good performance. The role of the interface layer may be to increase the tunnel recombination as well as to act as a diffusion barrier to dopants
Keywords :
amorphous semiconductors; diffusion barriers; electron-hole recombination; elemental semiconductors; hydrogen; short-circuit currents; silicon; solar cells; valence bands; 13.56 MHz; 15 nm; 160 C; 9.63 percent; 9.9 percent; Si:H; SnO2:F; SnO2:F coated glass; amorphous silicon based p-i-n solar cell; blue spectral response; buffer layer; computer simulations; electron back diffusion barrier; fill factor; n-μc-Si:H; open circuit voltage; oxide interface layer; p-μc-Si:H window layer; p-microcrystalline silicon; p/i interface; recombination reduction; short circuit current; superstrate configuration; superstrate structure; tandem solar cells; thin p-μc-Si:H layer; tunnel junction; valence band offset; window layer; Amorphous silicon; Buffer layers; Frequency; Glass; PIN photodiodes; Photovoltaic cells; Short circuit currents; Temperature; Voltage; Windows;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564323