Title : 
Time-frequency analysis of stimulus-driven EEG activity by matching pursuit
         
        
            Author : 
Durka, P.J. ; Kelly, E.F. ; Blinowska, K.J.
         
        
            Author_Institution : 
Lab. of Med. Phys., Warsaw Univ., Poland
         
        
        
        
            fDate : 
31 Oct-3 Nov 1996
         
        
        
            Abstract : 
A new method of time-frequency analysis. Matching Pursuit (MP), is being applied to extraction and quantification of time-varying EEG “driving” or frequency-following responses produced in human somatosensory cortex by vibrotactile stimulation of specific points on the hand or face. The MP method uses an iterative procedure to fit local signal structures optimally in terms of waveforms selected from a large and redundant dictionary, and is especially well suited to detection and characterization of transients. Systematic differences in patterns of harmonic response components were observed between peripheral and cortical responses. The authors´ initial results illustrate the properties of the method and clearly indicate its potential as a research tool for EEG studies of human cortical dynamics
         
        
            Keywords : 
electroencephalography; mechanoception; medical signal processing; time-frequency analysis; EEG studies research tool; cortical responses; electrodiagnostics; face; frequency-following responses; hand; harmonic response components patterns; human cortical dynamics; human somatosensory cortex; matching pursuit; peripheral responses; stimulus-driven EEG activity; transients; vibrotactile stimulation; Atomic measurements; Dictionaries; Electroencephalography; Humans; Laboratories; Large-scale systems; Matching pursuit algorithms; Physics; Signal analysis; Time frequency analysis;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
         
        
            Conference_Location : 
Amsterdam
         
        
            Print_ISBN : 
0-7803-3811-1
         
        
        
            DOI : 
10.1109/IEMBS.1996.652684