DocumentCode :
3201351
Title :
Automated measurement of skull circumference, cranial index, and braincase volume from pediatric computed tomography
Author :
Smith, K. ; Politte, D. ; Reiker, G. ; Nolan, T.S. ; Hildebolt, C. ; Mattson, C. ; Tucker, David ; Prior, F. ; Turovets, Sergei ; Larson-Prior, Linda J.
Author_Institution :
Sch. of Med., Washington Univ., St. Louis, MO, USA
fYear :
2013
fDate :
3-7 July 2013
Firstpage :
3977
Lastpage :
3980
Abstract :
Normative values of pediatric skull circumference, cranial index, and braincase volume would inform multiple disciplines including neurosurgery, plastic surgery and anthropology. Semi-automated methods exist for obtaining these data but are time consuming and require expertise. We report on a new method for automated extraction of in vivo measures of pediatric crania based on x-ray computed tomography scans (CT). Data were obtained from a clinical image repository for pediatric populations in whom no pathology was noted. The automated process showed good agreement with semi-automated measures, although there was a small bias for both braincase volume and circumference. We developed an open source program to automatically extract measures of skull circumference, cranial index, and braincase volume that are likely to prove useful in multiple disciplines.
Keywords :
brain; computerised tomography; medical image processing; neurophysiology; paediatrics; public domain software; CT; X-ray computed tomography scans; anthropology; automated measurement; clinical image repository; in vivo measures; neurosurgery; open source program; pediatric braincase volume; pediatric computed tomography; pediatric cranial index; pediatric populations; pediatric skull circumference; plastic surgery; semiautomated method; Computed tomography; Cranial; Educational institutions; Extraterrestrial measurements; Indexes; Skull; Volume measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2013.6610416
Filename :
6610416
Link To Document :
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