Title :
The evolution of ABBET
Author_Institution :
JEH Consulting Inc., Monument, CO, USA
Abstract :
This paper illuminates the principles and status of the ABBET (A Broad Based Environment for Test) family of IEEE standards, 1226.x, by exploring the history of the standards effort.
Keywords :
IEEE standards; automatic test equipment; object-oriented methods; ABBET; ATE; IEEE standards; broad-based test environment; history; Authorization; Circuit testing; Consumer electronics; Costs; Electronic equipment testing; History; Life testing; Standards Coordinating Committees; Standards development; System testing;
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
DOI :
10.1109/AUTEST.1995.522650
