DocumentCode
3201670
Title
Instruction level test methodology for CPU core software-based self-testing
Author
Shamshiri, Saeed ; Esmaeilzadeh, Hadi ; Navabi, Zainalabedin
Author_Institution
Electr. & Comput. Eng. Dept., Tehran Univ., Iran
fYear
2004
fDate
10-12 Nov. 2004
Firstpage
25
Lastpage
29
Abstract
TIS (S. Shamshiri et al., 2004) is an instruction level methodology for CPU core self-testing that enhances the instruction set of a CPU with test instructions. Since the functionality of test instructions is the same as the NOP instruction, NOP instructions can be replaced with test instructions so that online testing can be done with no performance penalty. TIS tests different parts of the CPU and detects stuck-at faults. This method can be employed in offline and online testing of all kinds of processors. Hardware-oriented implementation of TIS was proposed previously (S. Shamshiri et al., 2004) that tests just the combinational units of the processor. Contributions of this paper are first, a software-based approach that reduces the hardware overhead to a reasonable size and second, testing the sequential parts of the processor besides the combinational parts. Both hardware and software oriented approaches are implemented on a pipelined CPU core and their area overheads are compared. To demonstrate the appropriateness of the TIS test technique, several programs are executed and fault coverage results are presented.
Keywords
automatic testing; built-in self test; fault diagnosis; instruction sets; logic testing; microprocessor chips; system-on-chip; CPU core testing; NOP instruction; built-in self test; fault coverage; instruction level testing; offline testing; online testing; software-based self-testing; stuck-at fault detection; test instruction set; Assembly; Automatic testing; Built-in self-test; Central Processing Unit; Circuit faults; Circuit testing; Hardware; Process design; Sequential analysis; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International
ISSN
1552-6674
Print_ISBN
0-7803-8714-7
Type
conf
DOI
10.1109/HLDVT.2004.1431227
Filename
1431227
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