• DocumentCode
    3201670
  • Title

    Instruction level test methodology for CPU core software-based self-testing

  • Author

    Shamshiri, Saeed ; Esmaeilzadeh, Hadi ; Navabi, Zainalabedin

  • Author_Institution
    Electr. & Comput. Eng. Dept., Tehran Univ., Iran
  • fYear
    2004
  • fDate
    10-12 Nov. 2004
  • Firstpage
    25
  • Lastpage
    29
  • Abstract
    TIS (S. Shamshiri et al., 2004) is an instruction level methodology for CPU core self-testing that enhances the instruction set of a CPU with test instructions. Since the functionality of test instructions is the same as the NOP instruction, NOP instructions can be replaced with test instructions so that online testing can be done with no performance penalty. TIS tests different parts of the CPU and detects stuck-at faults. This method can be employed in offline and online testing of all kinds of processors. Hardware-oriented implementation of TIS was proposed previously (S. Shamshiri et al., 2004) that tests just the combinational units of the processor. Contributions of this paper are first, a software-based approach that reduces the hardware overhead to a reasonable size and second, testing the sequential parts of the processor besides the combinational parts. Both hardware and software oriented approaches are implemented on a pipelined CPU core and their area overheads are compared. To demonstrate the appropriateness of the TIS test technique, several programs are executed and fault coverage results are presented.
  • Keywords
    automatic testing; built-in self test; fault diagnosis; instruction sets; logic testing; microprocessor chips; system-on-chip; CPU core testing; NOP instruction; built-in self test; fault coverage; instruction level testing; offline testing; online testing; software-based self-testing; stuck-at fault detection; test instruction set; Assembly; Automatic testing; Built-in self-test; Central Processing Unit; Circuit faults; Circuit testing; Hardware; Process design; Sequential analysis; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International
  • ISSN
    1552-6674
  • Print_ISBN
    0-7803-8714-7
  • Type

    conf

  • DOI
    10.1109/HLDVT.2004.1431227
  • Filename
    1431227