DocumentCode :
3201902
Title :
A GaAs MESFET large-signal circuit model for nonlinear analysis
Author :
Sango, M. ; Pitzalis, O. ; Lerner, L. ; McGuire, C. ; Wang, P. ; Childs, W.
Author_Institution :
EEsof Inc., Westlake Village, CA, USA
fYear :
1988
fDate :
25-27 May 1988
Firstpage :
1053
Abstract :
A large-signal GaAs MESFET model for performing nonlinear microwave simulations with SPICE or the Microwave SPICE and Libra programs is described. The model includes accurate analytical representation of the dependence of DC transconductance, gate-to-source capacitance, gate-to-drain capacitance, input and noise resistances, and drain-to-source resistance on operating gate-to-source and drain-to-source voltages. The model also functions as a master linear model that accurately replicates measured microwave S-parameters at arbitrarily chosen bias points within the transistor´s useful operating C-V range. Microwave SPICE harmonic distortion simulations with the model compare favorably with measurements for an NEC NE71000 GaAs MESFET.<>
Keywords :
III-V semiconductors; Schottky gate field effect transistors; circuit CAD; gallium arsenide; harmonic generation; nonlinear network analysis; semiconductor device models; solid-state microwave devices; C-V range; DC transconductance; GaAs; Libra programs; MESFET; MESFET model; Microwave SPICE; NE71000; NEC; SPICE; circuit CAD; drain-to-source resistance; drain-to-source voltages; gate to source voltage; gate-to-drain capacitance; gate-to-source capacitance; harmonic distortion simulations; harmonic generation; input resistance; large-signal circuit model; master linear model; microwave S-parameters; noise resistances; nonlinear analysis; nonlinear microwave simulations; Analytical models; Capacitance; Circuit noise; Circuit simulation; Distortion measurement; Gallium arsenide; MESFET circuits; Microwave measurements; SPICE; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/MWSYM.1988.22212
Filename :
22212
Link To Document :
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