DocumentCode
3202359
Title
Silicon nanowire based radio-frequency spectrum analyser
Author
Corcoran, B. ; Vo, T.D. ; Pelusi, M. ; Monat, C. ; Xu, D.X. ; Densmore, A. ; Ma, R. ; Janz, S. ; Moss, D.J. ; Eggleton, B.J.
Author_Institution
Inst. for Photonics &, Opt. Sci. (IPOS), Univ. of Sydney, Sydney, NSW, Australia
fYear
2010
fDate
1-3 Sept. 2010
Firstpage
365
Lastpage
367
Abstract
We demonstrate a silicon nanowire based radio-frequency spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.
Keywords
amplitude shift keying; elemental semiconductors; high-speed optical techniques; nanophotonics; nanowires; optical communication equipment; optical dispersion; optical losses; silicon; spectral analysers; Si; bit rate 640 Gbit/s; free-carrier dispersion; nonlinear loss; on-off-keying; radiofrequency spectrum analyser; silicon nanowire; ultrahigh speed optical data; High speed optical techniques; Modulation; Nonlinear optics; Optical pulses; Optical waveguides; Probes; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Group IV Photonics (GFP), 2010 7th IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-6344-2
Type
conf
DOI
10.1109/GROUP4.2010.5643325
Filename
5643325
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