DocumentCode :
3202414
Title :
An event-based network-on-chip monitoring service
Author :
Ciordas, C. ; Basten, Twan ; Radulescu, Andreea ; Goossens, Kees ; Meerbergen, J.
Author_Institution :
Eindhoven Univ. of Technol., Netherlands
fYear :
2004
fDate :
10-12 Nov. 2004
Firstpage :
149
Lastpage :
154
Abstract :
Networks on chip (NoCs) are a scalable interconnect solution for large scale multiprocessor systems on chip (SoCs). However, little attention has been paid so far to the monitoring and debugging support for NoC-based systems. We propose a generic online event-based NoC monitoring service, based on hardware probes attached to NoC components. The proposed monitoring service offers run-time observability of NoC behavior and supports system-level and application debugging. The defined service can be accessed and configured at run-time from any network interface port. We present a probe architecture for the monitoring service, together with its associated programming model and traffic management strategies. We prove the feasibility of our approach via a prototype implementation for the AEthereal NoC. The additional monitoring traffic is low; typical monitoring connection configuration for a NoC-based SoC application needs only 4.8KB/s, which is 6 orders of magnitude lower than the 2GB/s per link raw bandwidth offered by the AEthereal NoC.
Keywords :
bandwidth allocation; monitoring; multiprocessing systems; network interfaces; probes; system-on-chip; telecommunication traffic; associated programming model; hardware probe architecture; large scale multiprocessor system; link raw bandwidth; monitoring connection configuration; network interface port; online event-based network-on-chip monitoring service; scalable interconnect solution; system-on-chip; traffic management strategy; Debugging; Large-scale systems; Monitoring; Multiprocessing systems; Network-on-a-chip; Probes; Runtime; System-on-a-chip; Telecommunication traffic; Traffic control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International
ISSN :
1552-6674
Print_ISBN :
0-7803-8714-7
Type :
conf
DOI :
10.1109/HLDVT.2004.1431260
Filename :
1431260
Link To Document :
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