DocumentCode :
3202432
Title :
Thick-film NTC thermistors based on spinel-type semiconducting electroceramics
Author :
Brunets, I. ; Mrooz, O. ; Shpotyuk, O. ; Altenburg, H.
Author_Institution :
Fachhochschule Munster/ Univ. of Appl. Sci., Steinfurt, Germany
Volume :
2
fYear :
2004
fDate :
16-19 May 2004
Firstpage :
503
Abstract :
Thick-film NTC thermistors based on spinel-type semiconducting electroceramics of different composition /Cu0.1Ni0.1Co1.6Mn1.2O4 (No.1), Cu0.1Ni0.8Co0.21Mn1.9O4 (No.2), and Cu0.8Ni0.1Co0.2Mn1.9O4 (No.3)/ were fabricated. Basic bulk ceramics and fired thick films were characterized by XRD, SEM and EDX microanalysis. Thick films of No. 1-2 ceramics showed higher density and microstructure homogeneity over those of No.3 ceramics. The electrical parameters of planar thick-film and disc-type NTC thermistors were determined and compared. Depending on chemical composition of ceramics, the prepared thick-film elements showed the resistivities in the range of 2 ÷ 40 Ω·m, being approx. the 1-2 orders of magnitude larger over those of disc thermistors. The values of constant B2585/ ranged from 2980 to 3690 K. Taking into account good reproducibility and satisfactory sensitivities (the values of TRC α≤-4 %/K) of Cu0.1Ni0.1Co1.6Mn1.2O4- and Cu0.1Ni0.8Co0.2Mn1.9O4-based thickfilm NTC thermistors, they should be suitable as accurate temperature sensors.
Keywords :
X-ray chemical analysis; X-ray diffraction; ceramics; cobalt compounds; copper compounds; manganese compounds; nickel compounds; scanning electron microscopy; semiconductor materials; thermistors; thick film resistors; 2 to 40 ohmm; 2980 to 3690 K; Cu0.1Ni0.1Co1.6Mn1.2O4; Cu0.1Ni0.8Co0.21Mn1.9O4; Cu0.8Ni0.1Co0.2Mn1.9O4; EDX; SEM; XRD; bulk ceramics; chemical composition; electrical parameters; fired thick films; good reproducibility; resistivities; satisfactory sensitivities; spinel-type semiconducting electroceramics; temperature sensors; thick-film NTC thermistors; Ceramics; Chemical elements; Conductivity; Microstructure; Reproducibility of results; Semiconductivity; Temperature sensors; Thermistors; Thick films; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2004. 24th International Conference on
Print_ISBN :
0-7803-8166-1
Type :
conf
DOI :
10.1109/ICMEL.2004.1314873
Filename :
1314873
Link To Document :
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