Title :
Simulations of Error-Induced Beam Degradation in Fermilab´s Booster Synchrotron
Author :
Yoon, P.S. ; Chou, W. ; Bohn, C.L.
Author_Institution :
University of Rochester, Rochester, NY 14627, USA, E-mail: syoon@fnal.gov
Abstract :
Individual particle orbits in a beam will respond to both external focusing and accelerating forces as well as internal space-charge forces. The external forces will reflect unavoidable systematic and random machine errors, or imperfections, such as jitter in magnet and radio-frequency power supplies, as well as translational and rotational magnet alignment errors. The beam responds in a self-consistent fashion to these errors; they continually do work on the beam and thereby act as a constant source of energy input. Consequently, halo formation and emittance growth can be induced, resulting in beam degradation and loss. We have upgraded the ORBIT-FNAL package and used it to compute effects of machine errors on emittance dilution and halo formation in the existing FNAL-Booster synchrotron. This package can be applied to study other synchrotrons and storage rings as well.
Keywords :
Acceleration; Degradation; Jitter; Orbits; Packaging machines; Particle beams; Power supplies; Radio frequency; Storage rings; Synchrotrons;
Conference_Titel :
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Conference_Location :
Knoxville, TN, USA
Print_ISBN :
0-7803-8859-3
DOI :
10.1109/PAC.2005.1590797