Title :
Issues involved in reuse library for design for test
Author :
Carmichael, L. ; Damarla, T. ; Chug, M.J. ; Chung, M.J.
Author_Institution :
Phys. Sci. Directorate, US Army Res. Lab., Ft. Monmouth, NJ, USA
Abstract :
Test has historically represented a significant amount of the cost associated with systems. Advancements in design automation and the application of concurrent engineering has allowed test to be considered when designing systems. The early inclusion of test into the design cycle and the reuse of design incorporating test information reduces the total time and cost associated with system development. This paper reports on the implementation of a design-for-test reuse data model and highlights the issues involved in creating a design-for-test reuse library (i.e. what test information should be included; allocation of test resources; etc.). Additionally, an example of the design-for-test reuse data model is presented.
Keywords :
automatic testing; concurrent engineering; design for testability; resource allocation; concurrent engineering; design automation; design cycle; design for test; reuse data model; reuse library; system development; test information; test resource allocation; Built-in self-test; Circuit testing; Controllability; Design for testability; Latches; Libraries; Linear feedback control systems; Logic; Observability; Shift registers;
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
DOI :
10.1109/AUTEST.1995.522658