DocumentCode :
3202530
Title :
Analysis of the influence of processor hidden registers on the accuracy of fault injection techniques
Author :
Gil, D. ; Gracia, J. ; Baraza, J.C. ; Gil, P.J.
Author_Institution :
Fault Tolerant Syst. Group, Polytech. Univ. of Valencia, Spain
fYear :
2004
fDate :
10-12 Nov. 2004
Firstpage :
173
Lastpage :
178
Abstract :
Modern processors tend to increase the number of registers, being part of them not accessible by the instruction set. Traditionally, the effect of faults in these hidden registers has not been considered during system validation using fault injection. In this paper, a study of the importance of faults in hidden registers is performed. Firstly, we have analysed the sensitivity of hidden registers to faults in combinational logic. In a second phase, we have analysed the impact of the faults occurred in hidden registers on system behaviour. A broad set of permanent and transient faults have been injected into the models of two typical commercial microcontrollers, using a VHDL-based fault injection tool developed by our research group. The results obtained indicate that the incidence of hidden registers is not negligible, and in some cases is even notable. This fact suggests that widely used fault injection techniques such as SWIFI could not be enough to perform a full and representative validation of modern processors, and it would be necessary to complement with other fault injection techniques that have a higher degree of accessibility.
Keywords :
fault tolerant computing; hardware description languages; logic testing; microcontrollers; VHDL-based fault injection tool; combinational logic; fault injection techniques; instruction set; microcontrollers; modern processors; processor hidden register; system behaviour; Computational modeling; Computer errors; Fault tolerant systems; Gas insulated transmission lines; Hardware; Logic; Microcontrollers; Prototypes; Reduced instruction set computing; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International
ISSN :
1552-6674
Print_ISBN :
0-7803-8714-7
Type :
conf
DOI :
10.1109/HLDVT.2004.1431266
Filename :
1431266
Link To Document :
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