DocumentCode :
3202592
Title :
The influence of material structure of thick film resistor on C-V characteristic
Author :
Pelikánová, Ivana Beshajová
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ., Prague, Czech Republic
fYear :
2001
fDate :
2001
Firstpage :
142
Lastpage :
145
Abstract :
The materials for thick film resistive layers are inhomogeneous mixtures. The layers contain particles of conductive functional component (in this case, carbonic) dissipated in an insulative matrix. The current-voltage characteristics of resistors prepared by thick film technology are nonlinear. The deviation from linearity of the C-V characteristic may have contributions from both the resistive layer material and the contact-resistive layer interface. The object of this work was the investigation of the influence of these two systems, the resistive layer and the resistive layer/contact interface, with regard to their influence on the nonlinearity. Measurement of third harmonic voltage was used for determination of nonlinearity of the C-V characteristic, as direct measurement of the C-V characteristic does not enable discovery of the small linearity deviation of the C-V characteristic. The samples were powered by a pure sinusoidal signal. The pure sinusoidal signal was distorted by transit through layer and interface inhomogeneity. For investigation, sample resistors with different size (width and length) were used. The third harmonics measurement was performed on samples powered by a signal with constant current density and constant current
Keywords :
electric current; electrical contacts; electron device testing; harmonic analysis; interface structure; thick film resistors; C-V characteristic; I-V characteristic nonlinearity; conductive functional component particles; constant current density signal; contact-resistive layer interface; current-voltage characteristics; direct measurement; distortion; inhomogeneous mixtures; insulative matrix; interface inhomogeneity; linearity deviation; material structure; nonlinear current-voltage characteristics; pure sinusoidal signal; resistive layer; resistive layer material; resistive layer/contact interface; thick film resistive layers; thick film resistor; thick film technology; third harmonic voltage measurement; third harmonics measurement; Capacitance-voltage characteristics; Conducting materials; Current-voltage characteristics; Distortion measurement; Insulation; Linearity; Power system harmonics; Resistors; Thick films; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Conference_Location :
Calimanesti-Caciulata
Print_ISBN :
0-7803-7111-9
Type :
conf
DOI :
10.1109/ISSE.2001.931034
Filename :
931034
Link To Document :
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