• DocumentCode
    3202708
  • Title

    Semi-supervised adaptation in ssvep-based brain-computer interface using tri-training

  • Author

    Bender, Thomas ; Kjaer, Troels W. ; Thomsen, C.E. ; Sorensen, Helge Bjarup Dissing ; Puthusserypady, Sadasivan

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    2013
  • fDate
    3-7 July 2013
  • Firstpage
    4279
  • Lastpage
    4282
  • Abstract
    This paper presents a novel and computationally simple tri-training based semi-supervised steady-state visual evoked potential (SSVEP)-based brain-computer interface (BCI). It is implemented with autocorrelation-based features and a Naïve-Bayes classifier (NBC). The system uses nine characters presented on a 100 Hz CRT-monitor, three scalp electrodes for signal acquisition, a gUSB-amp for preamplification and two PCs for data-processing and stimulus control respectively. Preliminary test results of the system on nine healthy subjects, with and without tri-training, indicates that the accuracy improves as a result of tri-training.
  • Keywords
    Bayes methods; biomedical electrodes; brain-computer interfaces; cathode-ray tubes; correlation methods; feature extraction; medical signal processing; signal classification; visual evoked potentials; CRT-monitor; Naive-Bayes classifier; PC; SSVEP-based brain-computer interface; accuracy; autocorrelation-based feature; data processing; frequency 100 Hz; gUSB-amp; scalp electrode; signal acquisition; signal preamplification; stimulus control; tritraining based semisupervised steady-state visual evoked potential-based BCI; Accuracy; Brain-computer interfaces; Correlation; Error analysis; Signal to noise ratio; Training; Visualization; Autocorrelation; Brain-Computer Interface; Naïve-Bayes Classifier; Steady-State Visual Evoked Potentials; Tri-training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
  • Conference_Location
    Osaka
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2013.6610491
  • Filename
    6610491