A Systematic Approach to Reduce Process-Induced Shunts in Back-Contacted MC-Si Solar Cells

Author

Granek, Filip ; Weeber, Arthur ; Tool, Kees ; Kinderman, Ronald ; de Jong, Pim

Author_Institution

ECN Solar Energy, Petten

Volume

2

fYear

2006

fDate

38838

Firstpage

1319

Lastpage

1322

Abstract

One of the main reasons why back-contact (PUM) cells stay somewhat behind in efficiency is because of their lower shunt resistance. A simple method was developed to determine the shunt resistance of the individual process-induced shunt paths. These contributions have led to an electrical model describing the process-induced shunt paths. Individual shunt paths were analysed in detail. Changes in processing were introduced to eliminate the shunting problems. These changes resulted in the shunt resistances beyond 5 kOmegacm² on 225 cm² cells with industrial processing

Keywords

contact resistance; electrical contacts; elemental semiconductors; semiconductor device models; silicon; solar cells; Si; back-contacted microcrystalline-Si solar cells; electrical model; individual process-induced shunt path; industrial processing; shunt resistance; systematic approach; Costs; Electric resistance; Laser ablation; Metallization; Photovoltaic cells; Ring lasers; Shunt (electrical); Silicon; Silver; Solar energy;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on

Conference_Location

Waikoloa, HI

Print_ISBN

1-4244-0017-1

Electronic_ISBN

1-4244-0017-1

Type

conf

DOI

10.1109/WCPEC.2006.279673

Filename

4059887