Title :
A Systematic Approach to Reduce Process-Induced Shunts in Back-Contacted MC-Si Solar Cells
Author :
Granek, Filip ; Weeber, Arthur ; Tool, Kees ; Kinderman, Ronald ; de Jong, Pim
Author_Institution :
ECN Solar Energy, Petten
Abstract :
One of the main reasons why back-contact (PUM) cells stay somewhat behind in efficiency is because of their lower shunt resistance. A simple method was developed to determine the shunt resistance of the individual process-induced shunt paths. These contributions have led to an electrical model describing the process-induced shunt paths. Individual shunt paths were analysed in detail. Changes in processing were introduced to eliminate the shunting problems. These changes resulted in the shunt resistances beyond 5 kOmegacm2 on 225 cm2 cells with industrial processing
Keywords :
contact resistance; electrical contacts; elemental semiconductors; semiconductor device models; silicon; solar cells; Si; back-contacted microcrystalline-Si solar cells; electrical model; individual process-induced shunt path; industrial processing; shunt resistance; systematic approach; Costs; Electric resistance; Laser ablation; Metallization; Photovoltaic cells; Ring lasers; Shunt (electrical); Silicon; Silver; Solar energy;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279673
