Title :
Diminution of errors in the technological process of hybrid integrated circuits by the implementation of the microcontrollers
Author :
Vasile, Alexandru
Author_Institution :
Bucharest Politehnica Univ., Romania
Abstract :
During technological processing, performances and costs are affected by errors due to technological variations and the instability of the information system components that monitor the process. The hybrid integrated circuit (HIC) technological process for the automobile industry is entirely automatic. Studies of this process determined the main reasons for errors (nonuniformity of materials, variation of environmental conditions, high level noises that appear during data acquisition, and the reaction of machines to system commands). One solution that is both reliable and very cheap is assured by one upgrade of the information system using local elements based on the Intel 80C852 microcontroller. This solution realizes correction of the errors during local data acquisition and cancellation of data transmission errors in the technological process. Also, intelligent elements built with the Intel 80C852 microcontroller were added to the functional adjustments to realize monitoring of the environmental conditions and of the statistical data picked up during the working period of the final products. This paper presents a data acquisition local module built with an adaptive filter, the associated software with very short execution time, the generalized product model, the most frequent error types at several points of the technological process, the central place for adjustment and comparative results obtained after the modernization process
Keywords :
adaptive filters; automotive electronics; data acquisition; environmental degradation; error analysis; error correction; hybrid integrated circuits; integrated circuit reliability; integrated circuit yield; microcontrollers; noise; process monitoring; Intel 80C852 microcontroller; adaptive filter; associated software; automobile industry; data acquisition; data acquisition local module; data transmission error cancellation; environmental conditions; environmental conditions variation; error correction; error diminution; execution time; frequent error types; generalized product model; high level noises; hybrid integrated circuit technological process; hybrid integrated circuits; information system component instability; information system upgrade; intelligent elements; local data acquisition; machine reaction; materials nonuniformity; microcontroller implementation; modernization process; process costs; process errors; process monitoring; process performance; reliability; statistical data; system commands; technological process; technological variations; Automobiles; Automotive materials; Computer errors; Costs; Data acquisition; Error correction; Hybrid integrated circuits; Information systems; Integrated circuit technology; Microcontrollers;
Conference_Titel :
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Conference_Location :
Calimanesti-Caciulata
Print_ISBN :
0-7803-7111-9
DOI :
10.1109/ISSE.2001.931079