Title :
Modeling and analysis of accelerated life test data
Author_Institution :
Dept. of Microelectron., Tech. Univ. of Sofia, Bulgaria
Abstract :
An algorithm has been developed to implement accelerated life test data analysis for multiple type stress. The advantage is that it combines in one model most of the known life-stress relationships for one or two types of stresses such as the temperature-nonthermal modes. The solution to this model provides the engineers with an opportunity to expand their selection types, stresses and test conditions when the products are tested
Keywords :
data analysis; electronic equipment testing; life testing; thermal stresses; accelerated life test data; accelerated life test data analysis algorithm; life-stress relationships; modeling; multiple type stress; temperature-nonthermal stress modes; test conditions; test stresses; Acceleration; Data analysis; Life estimation; Life testing; Microelectronics; Performance analysis; Performance evaluation; Statistical analysis; Temperature; Thermal stresses;
Conference_Titel :
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Conference_Location :
Calimanesti-Caciulata
Print_ISBN :
0-7803-7111-9
DOI :
10.1109/ISSE.2001.931089