DocumentCode :
3203245
Title :
Modeling and analysis of accelerated life test data
Author :
Andonova, Anna
Author_Institution :
Dept. of Microelectron., Tech. Univ. of Sofia, Bulgaria
fYear :
2001
fDate :
2001
Firstpage :
306
Lastpage :
309
Abstract :
An algorithm has been developed to implement accelerated life test data analysis for multiple type stress. The advantage is that it combines in one model most of the known life-stress relationships for one or two types of stresses such as the temperature-nonthermal modes. The solution to this model provides the engineers with an opportunity to expand their selection types, stresses and test conditions when the products are tested
Keywords :
data analysis; electronic equipment testing; life testing; thermal stresses; accelerated life test data; accelerated life test data analysis algorithm; life-stress relationships; modeling; multiple type stress; temperature-nonthermal stress modes; test conditions; test stresses; Acceleration; Data analysis; Life estimation; Life testing; Microelectronics; Performance analysis; Performance evaluation; Statistical analysis; Temperature; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Conference_Location :
Calimanesti-Caciulata
Print_ISBN :
0-7803-7111-9
Type :
conf
DOI :
10.1109/ISSE.2001.931089
Filename :
931089
Link To Document :
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