DocumentCode :
3203278
Title :
Diagnostics of large-area solar cell homogeneity using LBIV method
Author :
Benda, V. ; Asresahegn, A.L.
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ., Praha, Czech Republic
Volume :
2
fYear :
2004
fDate :
16-19 May 2004
Firstpage :
671
Abstract :
The paper refers about a possibility to check recombination rate distribution over the area of power (large-area) solar cells from measured values of open circuit voltage VOC using local irradiation by monochromatic light a suitable wavelengths (LBIV - Light Beam Initiated Voltage). The method can give information both about recombination centres distribution in large-area solar cells and surface recombination rate at the antireflection coating. From VOC distribution, also position and extent of local defects can also be determined. The method can be used to investigate the influence of technology on characteristics of solar cells as an in-process checking with the aim of increasing efficiency and reliability of solar cells.
Keywords :
OBIC; carrier lifetime; current density; solar cell arrays; surface recombination; LBIV method diagnostics; Light Beam Initiated Voltage; antireflection coating; large-area solar cell homogeneity; open circuit voltage; power solar cells; recombination centres distribution; recombination rate distribution; surface recombination rate; Area measurement; Circuits; Current density; Fabrication; Photovoltaic cells; Power measurement; Solar power generation; Surface resistance; Voltage; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2004. 24th International Conference on
Print_ISBN :
0-7803-8166-1
Type :
conf
DOI :
10.1109/ICMEL.2004.1314919
Filename :
1314919
Link To Document :
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