Title :
Exploiting jump-resonance hysteresis in silicon cochlea for formant trajectory encoding
Author :
Aono, Kenji ; Shaga, Ravi K. ; Chakrabartty, Shantanu
Author_Institution :
Michigan State Univ., East Lansing, MI, USA
Abstract :
Jump resonance is a phenomenon observed in nonlinear circuits where the output exhibits abrupt jumps when the frequency of the input signal is varied. In literature, several methods have been proposed for modeling and predicting of jump-resonance, which has led to circuit designs that are optimized to avoid this non-linear phenomenon. In this paper we propose exploiting jump-resonance based hystresis, observed in silicon cochlea, for encoding frequency and specifically formant trajectories in speech signal. Using experimental prototypes fabricated in a 0.5μm CMOS process, we show that the features extracted from a jump-resonance based silicon cochlea are more discriminative for speech based biometrics as compared to features extracted from a conventional silicon cochlea.
Keywords :
CMOS integrated circuits; circuit resonance; speech processing; CMOS process; encoding frequency; formant trajectory encoding; jump-resonance hysteresis; nonlinear circuit; silicon cochlea; size 0.5 micron; speech based biometrics; speech signal; Frequency measurement; Hysteresis; Silicon; Speaker recognition; Speech; Speech recognition; Trajectory; Gm-C filter; formant trajectory encoding; jump-resonance; silicon cochlea; speaker recognition;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6291963