Title :
The RAD750TM-a radiation hardened PowerPCTM processor for high performance spaceborne applications
Author :
Berger, Richard W. ; Bayles, Devin ; Brown, Ronald ; Doyle, Scott ; Kazemzadeh, Abbas ; Knowles, Ken ; Moser, David ; Rodgers, John ; Saari, Brian ; Stanley, Dan ; Grant, Basil
Author_Institution :
BAE Syst., Manassas, VA, USA
Abstract :
BAE SYSTEMS has developed the RAD750TM, a fully licensed radiation hardened implementation of the PowerPC 750TM microprocessor, based on the original design database. The processor is implemented in a 2.5 volt, 0.25 micron, six-layer metal CMOS technology. Employing a superscalar RISC architecture, processor performance of 240 million Dhrystone 2.1 instructions per second (MIPS) at 133 MHz is provided, while dissipating less than six watts of power. The RAD750 achieves radiation hardness of 1E-11 upsets/bit-day and is designed for use in high performance spaceborne applications. A new companion ASIC, the Power PCI, provides the bridge between the RAD750, the 33 MHz PCI backplane bus, and system memory. The Power PCI is implemented in a 3.3 volt, 0.5 micron, five-layer metal CMOS technology, and achieves radiation hardness of <1E-10 upsets/bit-day. This paper describes the implementation of both designs
Keywords :
CMOS integrated circuits; application specific integrated circuits; computer interfaces; microprocessor chips; radiation hardening (electronics); reduced instruction set computing; space vehicle electronics; 0.25 μ; 0.25 mum; 0.5 μ; 0.5 mum; 133 MHz; 2.5 V; 3.3 V; 33 MHz; ASIC; BAE; CMOS technology; PCI backplane bus; PowerPCTM processor; RAD750; radiation hardened implementation; radiation hardness; spaceborne applications; superscalar RISC architecture; Application specific integrated circuits; Backplanes; Bridge circuits; CMOS process; CMOS technology; Databases; Microprocessors; Radiation hardening; Reduced instruction set computing; Space technology;
Conference_Titel :
Aerospace Conference, 2001, IEEE Proceedings.
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-6599-2
DOI :
10.1109/AERO.2001.931184
