Title :
Physical and Technological Aspects of a-Si:H/c-Si Hetero-Junction Solar Cells
Author :
Schmidt, M. ; Angermann, H. ; Conrad, E. ; Korte, L. ; Laades, A. ; Maydell, K.V. ; Schubert, Ch ; Stangl, R.
Author_Institution :
Hahn-Meitner-Inst. Berlin
Abstract :
We report on the basic properties of a-Si:H/c-Si hetero-junctions, their effects on the recombination of excess carriers and its influence on the a-Si:H/c-Si hetero-junction solar cells. For this purpose we measured the gap state density distribution in thin a-Si:H layers, determined its dependence on deposition temperature and doping by an improved version of near UV-photoelectron emission spectroscopy. Furthermore, the Fermi level position in the a-Si:H and the valence band offset were directly measured. In combination with interface specific methods such as surface photovoltage analysis and our numerical simulation program AFORS-HET, we are able to find out the optimum in wafer pretreatment, doping and deposition temperature for efficient a-Si:H/c-Si solar cells without an i-type a-Si:H buffer layer. By a deposition at 210degC with an emitter doping of 2000 ppm of B2 H6 on a well cleaned pyramidal structured c-Si(p) wafer we reached 19.8 % certified efficiency
Keywords :
Fermi level; electron-hole recombination; elemental semiconductors; hydrogen; semiconductor heterojunctions; silicon; solar cells; surface photovoltage; ultraviolet photoelectron spectra; valence bands; 19.8 percent; 210 C; AFORS-HET; Fermi level; Si-Si:H; a-Si:H/c-Si heterojunctions; buffer layer; carrier recombination; heterojunction solar cells; numerical simulation program; surface photovoltage; ultraviolet-photoelectron emission spectroscopy; valence band; Doping; Heterojunctions; Numerical simulation; Photovoltaic cells; Silicon; Spectroscopy; Surface cleaning; Surface contamination; Surface resistance; Surface texture;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279722