Title :
Over 15% Efficient Hydrogenated Amorphous Silicon Based Triple-Junction Solar Cells Incorporating Nanocrystalline Silicon
Author :
Yan, Baojie ; Yue, Guozhen ; Owens, Jessica M. ; Yang, Jeffrey ; Guha, Subhendu
Author_Institution :
United Solar Ovonic Corp., Michigan
Abstract :
We report our recent progress in the optimization of a-Si:H, a-SiGe:H, and nc-Si:H materials for high efficiency triple-junction solar cells. The main technique for the optimization of a-Si:H and a-SiGe:H materials is using hydrogen dilution to approach the amorphous to nanocrystalline transition. The nc-Si:H intrinsic layers are deposited using a modified VHF glow discharge technique at high rates. The material quality and cell performance are improved by using hydrogen dilution profiling for controlling the nanocrystalline evolution. Two triple-junction structures have been studied. We achieve an initial active-area efficiency of 15.1% using an a-Si:H/a-SiGe:H/nc-Si:H triple-junction structure, and 14.1% using an a-Si:H/nc-Si:H/nc-Si:H configuration. After prolonged light soaking, both structures stabilized at 13.3%, which is higher than the 13.0% stable efficiency previously reported for an a-Si:H/a-SiGe:H/a-SiGe:H triple-junction structure
Keywords :
Ge-Si alloys; amorphous semiconductors; crystallisation; elemental semiconductors; hydrogen; nanostructured materials; semiconductor heterojunctions; semiconductor thin films; silicon; solar cells; 13.3 percent; 14.1 percent; 15.1 percent; Si:H-SiGe:H-Si:H; VHF glow discharge technique; amorphous-nanocrystalline transition; hydrogen dilution profiling; hydrogenated amorphous silicon based triple-junction solar cells; initial active-area efficiency; intrinsic layers; light soaking; nanocrystalline silicon; optimization; triple-junction structures; Amorphous materials; Amorphous silicon; Current density; Germanium silicon alloys; Glow discharges; Hydrogen; Photovoltaic cells; Silicon germanium; Stability; Wavelength measurement;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279748